A technique employed to image the magnetic properties of a surface with nanoscale resolution, it utilizes a sharp, magnetized tip attached to a cantilever. The tip scans the sample surface, and the magnetic forces between the tip and the sample cause the cantilever to deflect. This deflection is measured and used to create an image that represents the magnetic force gradient distribution on the surface. For instance, observing the domain structure in a magnetic recording medium or analyzing magnetic nanoparticles are typical applications.
This method provides significant advantages over traditional magnetic imaging techniques due to its high spatial resolution and sensitivity. Its development has enabled researchers to study magnetic phenomena at the micro and nanoscale, leading to advancements in materials science, data storage, and biomedicine. Historically, its evolution stemmed from the broader field of scanning probe microscopy, leveraging advancements in miniaturization and force detection.
